B.Sc. 2022, Applied Physics (Hohai university )
Co Advised by: Prof. Nan Wang
Research:
Electric current may induce microstructure changes in nanoelectronic devices. Electromigration has been known as a leading mechanism for structural change in materials under large current density. We will focus on calculating the electromigration force on low angle grain boundaries (GB) and predicting their motion by incorporating the force into a previously developed microstructural evolution model.